%0 Conference Paper %1 conf/vlsi-dat/TsaiKLC13 %A Tsai, Hui-Wen %A Ker, Ming-Dou %A Liu, Yi-Sheng %A Chuang, Ming-Nan %B VLSI-DAT %D 2013 %I IEEE %K dblp %P 1-4 %T Analysis and solution to overcome EOS failure induced by latchup test in a high-voltage integrated circuits. %U http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2013.html#TsaiKLC13 %@ 978-1-4673-4435-7

@inproceedings{conf/vlsi-dat/TsaiKLC13, added-at = {2015-09-28T00:00:00.000+0200}, author = {Tsai, Hui-Wen and Ker, Ming-Dou and Liu, Yi-Sheng and Chuang, Ming-Nan}, biburl = {https://www.bibsonomy.org/bibtex/2f639ca8c5fcfcc7e6c082ffc02f111bb/dblp}, booktitle = {VLSI-DAT}, crossref = {conf/vlsi-dat/2013}, ee = {http://dx.doi.org/10.1109/VLDI-DAT.2013.6533803}, interhash = {acb43f4c95b4b0be8ae32533ab9a51b8}, intrahash = {f639ca8c5fcfcc7e6c082ffc02f111bb}, isbn = {978-1-4673-4435-7}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2015-09-29T11:36:18.000+0200}, title = {Analysis and solution to overcome EOS failure induced by latchup test in a high-voltage integrated circuits.}, url = {http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2013.html#TsaiKLC13}, year = 2013 }