%0 Journal Article %1 journals/tcad/SukharevKNYKCTZ22 %A Sukharev, Valeriy %A Kteyan, Armen %A Najm, Farid N. %A Yi, Yong Hyeon %A Kim, Chris H. %A Choy, Jun-Ho %A Torosyan, Sofya %A Zhu, Yu %D 2022 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 11 %P 4837-4850 %T Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids. %U http://dblp.uni-trier.de/db/journals/tcad/tcad41.html#SukharevKNYKCTZ22 %V 41

@article{journals/tcad/SukharevKNYKCTZ22, added-at = {2022-11-13T00:00:00.000+0100}, author = {Sukharev, Valeriy and Kteyan, Armen and Najm, Farid N. and Yi, Yong Hyeon and Kim, Chris H. and Choy, Jun-Ho and Torosyan, Sofya and Zhu, Yu}, biburl = {https://www.bibsonomy.org/bibtex/2f7bcad39d2b61c0436aad7f89734ac78/dblp}, ee = {https://doi.org/10.1109/TCAD.2021.3134886}, interhash = {4243e0784c7e42d0f309d81df9d9813d}, intrahash = {f7bcad39d2b61c0436aad7f89734ac78}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 11, pages = {4837-4850}, timestamp = {2024-04-08T19:47:14.000+0200}, title = {Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad41.html#SukharevKNYKCTZ22}, volume = 41, year = 2022 }