%0 Journal Article %1 constantinescu2003challenges %A Constantinescu, C. %D 2003 %J Micro, IEEE %K challenges reliability vlsi %N 4 %P 14-19 %R 10.1109/MM.2003.1225959 %T Trends and challenges in VLSI circuit reliability %U http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1225959 %V 23 %X Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.

@article{constantinescu2003challenges, abstract = {Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.}, added-at = {2014-02-12T11:37:25.000+0100}, author = {Constantinescu, C.}, biburl = {https://www.bibsonomy.org/bibtex/2f7e280b258dea6287828103b8761764c/eberle18}, description = {IEEE Xplore Abstract - Trends and challenges in VLSI circuit reliability}, doi = {10.1109/MM.2003.1225959}, interhash = {deb0a6639ddb23b92fd111d493eafd18}, intrahash = {f7e280b258dea6287828103b8761764c}, issn = {0272-1732}, journal = {Micro, IEEE}, keywords = {challenges reliability vlsi}, month = {July}, number = 4, pages = {14-19}, timestamp = {2014-02-12T11:37:25.000+0100}, title = {Trends and challenges in VLSI circuit reliability}, url = {http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1225959}, volume = 23, year = 2003 }