%0 Conference Paper %1 conf/itc/MadgeGRMDSTT02 %A Madge, Robert %A Goh, B. H. %A Rajagopalan, V. %A Macchietto, C. %A Daasch, W. Robert %A Schuermyer, Chris %A Taylor, C. %A Turner, David %B ITC %D 2002 %I IEEE Computer Society %K dblp %P 673-682 %T Screening MinVDD Outliers Using Feed-Forward Voltage Testing. %U http://dblp.uni-trier.de/db/conf/itc/itc2002.html#MadgeGRMDSTT02 %@ 0-7803-7543-2

@inproceedings{conf/itc/MadgeGRMDSTT02, added-at = {2023-03-23T00:00:00.000+0100}, author = {Madge, Robert and Goh, B. H. and Rajagopalan, V. and Macchietto, C. and Daasch, W. Robert and Schuermyer, Chris and Taylor, C. and Turner, David}, biburl = {https://www.bibsonomy.org/bibtex/22b0553790673994af205f415e1b774de/dblp}, booktitle = {ITC}, crossref = {conf/itc/2002}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041819}, interhash = {2f8bb2619b3d4c6bdb3fc396e5a15796}, intrahash = {2b0553790673994af205f415e1b774de}, isbn = {0-7803-7543-2}, keywords = {dblp}, pages = {673-682}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:16.000+0200}, title = {Screening MinVDD Outliers Using Feed-Forward Voltage Testing.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2002.html#MadgeGRMDSTT02}, year = 2002 }