%0 Conference Paper %1 conf/essderc/LavievilleKTBDG16 %A Lavieville, R. %A Karatsori, Theano A. %A Theodorou, Christoforos G. %A Barraud, Sylvain %A Dimitriadis, C. A. %A Ghibaudo, Gérard %B ESSDERC %D 2016 %I IEEE %K dblp %P 142-145 %T Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs. %U http://dblp.uni-trier.de/db/conf/essderc/essderc2016.html#LavievilleKTBDG16 %@ 978-1-5090-2969-3

@inproceedings{conf/essderc/LavievilleKTBDG16, added-at = {2022-01-03T00:00:00.000+0100}, author = {Lavieville, R. and Karatsori, Theano A. and Theodorou, Christoforos G. and Barraud, Sylvain and Dimitriadis, C. A. and Ghibaudo, Gérard}, biburl = {https://www.bibsonomy.org/bibtex/2209f61c8ca08ab95dddb113a728982f2/dblp}, booktitle = {ESSDERC}, crossref = {conf/essderc/2016}, ee = {https://doi.org/10.1109/ESSDERC.2016.7599607}, interhash = {30207d45dd76b99433a994a376f21f88}, intrahash = {209f61c8ca08ab95dddb113a728982f2}, isbn = {978-1-5090-2969-3}, keywords = {dblp}, pages = {142-145}, publisher = {IEEE}, timestamp = {2024-04-10T10:01:40.000+0200}, title = {Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs.}, url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2016.html#LavievilleKTBDG16}, year = 2016 }