%0 Journal Article %1 journals/jssc/DeguchiST18 %A Deguchi, Yoshiaki %A Suzuki, Shun %A Takeuchi, Ken %D 2018 %J IEEE J. Solid State Circuits %K dblp %N 10 %P 2917-2926 %T Write and Read Frequency-Based Word-Line Batch VTH Modulation for 2-D and 3-D-TLC NAND Flash Memories. %U http://dblp.uni-trier.de/db/journals/jssc/jssc53.html#DeguchiST18 %V 53

@article{journals/jssc/DeguchiST18, added-at = {2020-08-30T00:00:00.000+0200}, author = {Deguchi, Yoshiaki and Suzuki, Shun and Takeuchi, Ken}, biburl = {https://www.bibsonomy.org/bibtex/2b3cd4b7e32a8c31536dc4b079e9988b7/dblp}, ee = {https://doi.org/10.1109/JSSC.2018.2852748}, interhash = {32e03d20e50fdb00da2d8377a20824e7}, intrahash = {b3cd4b7e32a8c31536dc4b079e9988b7}, journal = {IEEE J. Solid State Circuits}, keywords = {dblp}, number = 10, pages = {2917-2926}, timestamp = {2020-08-31T11:42:10.000+0200}, title = {Write and Read Frequency-Based Word-Line Batch VTH Modulation for 2-D and 3-D-TLC NAND Flash Memories.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc53.html#DeguchiST18}, volume = 53, year = 2018 }