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%0 Journal Article
%1 journals/tie/AvinoSalvadoBBRBRMP24
%A Avino-Salvado, Oriol
%A Buttay, Cyril
%A Bonet, Ferran
%A Raynaud, Christophe
%A Bevilacqua, Pascal
%A Rebollo, José
%A Morel, Hervé
%A Perpiñà, Xavier
%D 2024
%J IEEE Trans. Ind. Electron.
%K dblp
%N 5
%P 5285-5295
%T Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs.
%U http://dblp.uni-trier.de/db/journals/tie/tie71.html#AvinoSalvadoBBRBRMP24
%V 71
@article{journals/tie/AvinoSalvadoBBRBRMP24,
added-at = {2024-01-24T00:00:00.000+0100},
author = {Avino-Salvado, Oriol and Buttay, Cyril and Bonet, Ferran and Raynaud, Christophe and Bevilacqua, Pascal and Rebollo, José and Morel, Hervé and Perpiñà, Xavier},
biburl = {https://www.bibsonomy.org/bibtex/29396023e823fb4462f7540d98ffd119f/dblp},
ee = {https://doi.org/10.1109/TIE.2023.3281705},
interhash = {33a75052753d1b305b533e106f506271},
intrahash = {9396023e823fb4462f7540d98ffd119f},
journal = {IEEE Trans. Ind. Electron.},
keywords = {dblp},
month = May,
number = 5,
pages = {5285-5295},
timestamp = {2024-04-08T10:31:47.000+0200},
title = {Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs.},
url = {http://dblp.uni-trier.de/db/journals/tie/tie71.html#AvinoSalvadoBBRBRMP24},
volume = 71,
year = 2024
}
