%0 Conference Paper %1 conf/delta/ChehabMSW02 %A Chehab, Ali %A Makki, Rafic Z. %A Spica, Michael %A Wu, David %B DELTA %D 2002 %I IEEE Computer Society %K dblp %P 403-407 %T IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits. %U http://dblp.uni-trier.de/db/conf/delta/delta2002.html#ChehabMSW02 %@ 0-7695-1453-7

@inproceedings{conf/delta/ChehabMSW02, added-at = {2023-03-24T00:00:00.000+0100}, author = {Chehab, Ali and Makki, Rafic Z. and Spica, Michael and Wu, David}, biburl = {https://www.bibsonomy.org/bibtex/26ff5207450047b211cdf81db8ec007e5/dblp}, booktitle = {DELTA}, crossref = {conf/delta/2002}, ee = {https://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994659}, interhash = {3554b403c1f3a94d3c9d23f16e64fbca}, intrahash = {6ff5207450047b211cdf81db8ec007e5}, isbn = {0-7695-1453-7}, keywords = {dblp}, pages = {403-407}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T16:16:08.000+0200}, title = {IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits.}, url = {http://dblp.uni-trier.de/db/conf/delta/delta2002.html#ChehabMSW02}, year = 2002 }