%0 Conference Paper %1 conf/dac/HussG91 %A Huss, Scott D. %A Gyurcsik, Ronald S. %B DAC %D 1991 %E Newton, A. Richard %I ACM %K dblp %P 494-499 %T Optimal Ordering of Analog Integrated Circuit Tests to Minimize Test Time. %U http://dblp.uni-trier.de/db/conf/dac/dac91.html#HussG91 %@ 0-89791395-7

@inproceedings{conf/dac/HussG91, added-at = {2017-03-16T00:00:00.000+0100}, author = {Huss, Scott D. and Gyurcsik, Ronald S.}, biburl = {https://www.bibsonomy.org/bibtex/24ae81bd7c43fe4f7ad4ea68a5001d3e8/dblp}, booktitle = {DAC}, crossref = {conf/dac/1991}, editor = {Newton, A. Richard}, ee = {http://doi.acm.org/10.1145/127601.127718}, interhash = {35ce33d4ac26fa3789c9587a71392e09}, intrahash = {4ae81bd7c43fe4f7ad4ea68a5001d3e8}, isbn = {0-89791395-7}, keywords = {dblp}, pages = {494-499}, publisher = {ACM}, timestamp = {2017-03-17T11:41:05.000+0100}, title = {Optimal Ordering of Analog Integrated Circuit Tests to Minimize Test Time.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac91.html#HussG91}, year = 1991 }