%0 Conference Paper %1 conf/dac/BhattacharyaAA92 %A Bhattacharya, Debashis %A Agrawal, Prathima %A Agrawal, Vishwani D. %B DAC %D 1992 %E Schweikert, Daniel G. %I IEEE Computer Society Press %K dblp %P 159-164 %T Delay Fault Test Generation for Scan/Hold Circuits Using Boolean Expressions. %U http://dblp.uni-trier.de/db/conf/dac/dac92.html#BhattacharyaAA92 %@ 0-8186-2822-7

@inproceedings{conf/dac/BhattacharyaAA92, added-at = {2017-03-16T00:00:00.000+0100}, author = {Bhattacharya, Debashis and Agrawal, Prathima and Agrawal, Vishwani D.}, biburl = {https://www.bibsonomy.org/bibtex/2dfa1d2d4430bbd7bef4cc63e09e11ed3/dblp}, booktitle = {DAC}, crossref = {conf/dac/1992}, editor = {Schweikert, Daniel G.}, ee = {http://portal.acm.org/citation.cfm?id=113938.119386}, interhash = {35d1982ccd24678dbd8650778fec94d4}, intrahash = {dfa1d2d4430bbd7bef4cc63e09e11ed3}, isbn = {0-8186-2822-7}, keywords = {dblp}, pages = {159-164}, publisher = {IEEE Computer Society Press}, timestamp = {2017-03-17T11:40:52.000+0100}, title = {Delay Fault Test Generation for Scan/Hold Circuits Using Boolean Expressions.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac92.html#BhattacharyaAA92}, year = 1992 }