%0 Journal Article %1 journals/mr/ChirilaKRRW15 %A Chirila, Tudor %A Kaindl, Winfried %A Reimann, Tobias %A Rüb, Michael %A Wahl, Uwe %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1481-1485 %T Analysis of the role of the parasitic BJT of Super-Junction power MOSFET under TLP stress. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#ChirilaKRRW15 %V 55

@article{journals/mr/ChirilaKRRW15, added-at = {2022-07-18T00:00:00.000+0200}, author = {Chirila, Tudor and Kaindl, Winfried and Reimann, Tobias and Rüb, Michael and Wahl, Uwe}, biburl = {https://www.bibsonomy.org/bibtex/2c236b2f8c2e623a95360e36073b449c8/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.108}, interhash = {3737d1c29940d0befdf106a71ba04347}, intrahash = {c236b2f8c2e623a95360e36073b449c8}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1481-1485}, timestamp = {2024-04-09T02:49:20.000+0200}, title = {Analysis of the role of the parasitic BJT of Super-Junction power MOSFET under TLP stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#ChirilaKRRW15}, volume = 55, year = 2015 }