%0 Journal Article %1 journals/corr/abs-2311-07029 %A Zheng, Jialin %A Zhao, Zhengming %A Xu, Han %A Liu, Weicheng %A Zeng, Yangbin %D 2023 %J CoRR %K dblp %T Accurate Time-segmented Loss Model for SiC MOSFETs in Electro-thermal Multi-Rate Simulation. %U http://dblp.uni-trier.de/db/journals/corr/corr2311.html#abs-2311-07029 %V abs/2311.07029

@article{journals/corr/abs-2311-07029, added-at = {2023-11-15T00:00:00.000+0100}, author = {Zheng, Jialin and Zhao, Zhengming and Xu, Han and Liu, Weicheng and Zeng, Yangbin}, biburl = {https://www.bibsonomy.org/bibtex/2feb8cee407e5cf287d6279baca3c5200/dblp}, ee = {https://doi.org/10.48550/arXiv.2311.07029}, interhash = {373e3866d4a3ebd2d8c062047dacd12e}, intrahash = {feb8cee407e5cf287d6279baca3c5200}, journal = {CoRR}, keywords = {dblp}, timestamp = {2024-04-09T00:05:30.000+0200}, title = {Accurate Time-segmented Loss Model for SiC MOSFETs in Electro-thermal Multi-Rate Simulation.}, url = {http://dblp.uni-trier.de/db/journals/corr/corr2311.html#abs-2311-07029}, volume = {abs/2311.07029}, year = 2023 }