%0 Journal Article %1 journals/mr/ChatbouriTKS17 %A Chatbouri, S. %A Troudi, M. %A Kalboussi, A. %A Souifi, A. %D 2017 %J Microelectron. Reliab. %K dblp %P 227-232 %T Interface traps effect on the charge transport mechanisms in metal oxide semiconductor structures based on silicon nanocrystals. %U http://dblp.uni-trier.de/db/journals/mr/mr78.html#ChatbouriTKS17 %V 78

@article{journals/mr/ChatbouriTKS17, added-at = {2020-10-26T00:00:00.000+0100}, author = {Chatbouri, S. and Troudi, M. and Kalboussi, A. and Souifi, A.}, biburl = {https://www.bibsonomy.org/bibtex/2c47e59fbb6e66fd3936401be9fc4e4b8/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.09.010}, interhash = {3e228a90d6090c74a930e7f6e43a2855}, intrahash = {c47e59fbb6e66fd3936401be9fc4e4b8}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {227-232}, timestamp = {2020-10-27T12:44:39.000+0100}, title = {Interface traps effect on the charge transport mechanisms in metal oxide semiconductor structures based on silicon nanocrystals.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr78.html#ChatbouriTKS17}, volume = 78, year = 2017 }