%0 Conference Paper %1 conf/vts/GentAH17 %A Gent, Kelson %A Agrawal, Akash %A Hsiao, Michael S. %B VTS %D 2017 %I IEEE Computer Society %K dblp %P 1-6 %T A framework for fast test generation at the RTL. %U http://dblp.uni-trier.de/db/conf/vts/vts2017.html#GentAH17 %@ 978-1-5090-4482-5

@inproceedings{conf/vts/GentAH17, added-at = {2023-03-24T00:00:00.000+0100}, author = {Gent, Kelson and Agrawal, Akash and Hsiao, Michael S.}, biburl = {https://www.bibsonomy.org/bibtex/223fa867342243dca7ec62bc437083d96/dblp}, booktitle = {VTS}, crossref = {conf/vts/2017}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTS.2017.7928942}, interhash = {408c42ea579026f47b2e485ad4c027c1}, intrahash = {23fa867342243dca7ec62bc437083d96}, isbn = {978-1-5090-4482-5}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:42:17.000+0200}, title = {A framework for fast test generation at the RTL.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2017.html#GentAH17}, year = 2017 }