%0 Journal Article %1 journals/tcas/YiuWGS07 %A Yiu, Mimi %A Winstead, Chris %A Gaudet, Vincent C. %A Schlegel, Christian %D 2007 %J IEEE Trans. Circuits Syst. II Express Briefs %K %N 8 %P 675-679 %T Design for Testability of CMOS Analog Sum-Product Error-Control Decoders. %U http://dblp.uni-trier.de/db/journals/tcas/tcasII54.html#YiuWGS07 %V 54-II

@article{journals/tcas/YiuWGS07, added-at = {2023-12-12T21:38:12.000+0100}, author = {Yiu, Mimi and Winstead, Chris and Gaudet, Vincent C. and Schlegel, Christian}, biburl = {https://www.bibsonomy.org/bibtex/243c62c24526e7e863a0728e636be7066/admin}, ee = {https://doi.org/10.1109/TCSII.2007.898472}, interhash = {4126dc9c2026f9db92c4d9bb56f7ee6a}, intrahash = {43c62c24526e7e863a0728e636be7066}, journal = {IEEE Trans. Circuits Syst. II Express Briefs}, keywords = {}, number = 8, pages = {675-679}, timestamp = {2023-12-12T21:38:12.000+0100}, title = {Design for Testability of CMOS Analog Sum-Product Error-Control Decoders.}, url = {http://dblp.uni-trier.de/db/journals/tcas/tcasII54.html#YiuWGS07}, volume = {54-II}, year = 2007 }