%0 Journal Article %1 journals/iet-cds/JinODMB12 %A Jin, Jong Woo %A Oudwan, Maher %A Daineka, Dmitri %A Moustapha, Oumkelthoum %A Bonnassieux, Yvan %D 2012 %J IET Circuits Devices Syst. %K dblp %N 2 %P 118-121 %T Parameter extraction method for universal amorphous silicon thin-film transistors simulation program with integrated circuit emphasis model. %U http://dblp.uni-trier.de/db/journals/iet-cds/iet-cds6.html#JinODMB12 %V 6

@article{journals/iet-cds/JinODMB12, added-at = {2021-10-14T00:00:00.000+0200}, author = {Jin, Jong Woo and Oudwan, Maher and Daineka, Dmitri and Moustapha, Oumkelthoum and Bonnassieux, Yvan}, biburl = {https://www.bibsonomy.org/bibtex/2e47a64cc3150922e8b24d39f04571664/dblp}, ee = {https://doi.org/10.1049/iet-cds.2011.0124}, interhash = {4167e7362d82f411a7d39fd10755e779}, intrahash = {e47a64cc3150922e8b24d39f04571664}, journal = {IET Circuits Devices Syst.}, keywords = {dblp}, number = 2, pages = {118-121}, timestamp = {2024-04-08T16:07:25.000+0200}, title = {Parameter extraction method for universal amorphous silicon thin-film transistors simulation program with integrated circuit emphasis model.}, url = {http://dblp.uni-trier.de/db/journals/iet-cds/iet-cds6.html#JinODMB12}, volume = 6, year = 2012 }