%0 Conference Paper %1 conf/itc/SugaiN92 %A Sugai, Masao %A Nakatani, Takayuki %B ITC %D 1992 %I IEEE Computer Society %K dblp %P 321-327 %T AC Dynamic Testing of 20Bit Sigma-Delta Over-Sampling D/A Converter on a Mixed Signal Test System. %U http://dblp.uni-trier.de/db/conf/itc/itc1992.html#SugaiN92 %@ 0-7803-0760-7

@inproceedings{conf/itc/SugaiN92, added-at = {2023-03-23T00:00:00.000+0100}, author = {Sugai, Masao and Nakatani, Takayuki}, biburl = {https://www.bibsonomy.org/bibtex/2204dcd18f7d709756265648edf7e3f2c/dblp}, booktitle = {ITC}, crossref = {conf/itc/1992}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1992.527839}, interhash = {41ac8b19df22fdc8401e253bd46ae73b}, intrahash = {204dcd18f7d709756265648edf7e3f2c}, isbn = {0-7803-0760-7}, keywords = {dblp}, pages = {321-327}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:49.000+0200}, title = {AC Dynamic Testing of 20Bit Sigma-Delta Over-Sampling D/A Converter on a Mixed Signal Test System.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1992.html#SugaiN92}, year = 1992 }