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Secondary electron emission of chemical-vapor-deposited diamond by impact of slow H^+, D^+, H_2^+, C^+, O^+, and O_2^+ ions

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Journal of Applied Physics, (августа 2005)
DOI: 10.1063/1.1996855

Аннотация

We report on the measurements of the secondary electron yield of chemical-vapor-deposited diamond upon the reflection of primary H+, D+, H2+, C+, O+, and O2+ ions in an energy range of 50–1000 eV per atom at a 60° angle of incidence to the surface normal. Depending on the species and energy, a secondary electron yield between 0.1 and 2 was observed and remained unchanged over weeks without further periodic reconditioning of the surface and in spite of the moderate vacuum environment of 10–7 mbar. Semiempirical fit functions were found with a dependence on the inverse velocity and the square root of the atomic number of the projectiles.

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