Inproceedings,
Machine Learning Techniques for Escaped Defect Analysis in Software Testing.
L. Nascimento, R. Prudêncio, A. Mota, A. de Araujo Paiva Filho, P. Cruz, D. de Oliveira, and P. Moreira.SAST, page 47-53. ACM, (2023)
Meta data
- BibTeX key
- conf/sast/NascimentoPMFCO23
- entry type
- inproceedings
- booktitle
- SAST
- year
- 2023
- pages
- 47-53
- publisher
- ACM
- crossref
- conf/sast/2023
- ee
- https://doi.org/10.1145/3624032.3624039
- url
- http://dblp.uni-trier.de/db/conf/sast/sast2023.html#NascimentoPMFCO23
Tags
Users
Comments and Reviewsshow / hide
Cite this publication
More citation styles
- please select -%0 Conference Paper
%1 conf/sast/NascimentoPMFCO23
%A Nascimento, Lidia Perside Gomes
%A Prudêncio, Ricardo Bastos Cavalcante
%A Mota, Alexandre Cabral
%A de Araujo Paiva Filho, Audir
%A Cruz, Pedro Henrique Alves
%A de Oliveira, Daniel Cardoso Coelho Alves
%A Moreira, Pedro Roncoli Sarmet
%B SAST
%D 2023
%E Fontão, Awdren L.
%E Paiva, Débora M. B.
%E Borges, Hudson
%E Cagnin, Maria Istela
%E Fernandes, Patrícia Gomes
%E Borges, Vanessa
%E Melo, Silvana M.
%E Durelli, Vinicius H. S.
%E Canedo, Edna Dias
%I ACM
%K dblp
%P 47-53
%T Machine Learning Techniques for Escaped Defect Analysis in Software Testing.
%U http://dblp.uni-trier.de/db/conf/sast/sast2023.html#NascimentoPMFCO23
@inproceedings{conf/sast/NascimentoPMFCO23,
added-at = {2023-10-27T00:00:00.000+0200},
author = {Nascimento, Lidia Perside Gomes and Prudêncio, Ricardo Bastos Cavalcante and Mota, Alexandre Cabral and de Araujo Paiva Filho, Audir and Cruz, Pedro Henrique Alves and de Oliveira, Daniel Cardoso Coelho Alves and Moreira, Pedro Roncoli Sarmet},
biburl = {https://www.bibsonomy.org/bibtex/231efeb7914dd1c19538680e42433cecc/dblp},
booktitle = {SAST},
crossref = {conf/sast/2023},
editor = {Fontão, Awdren L. and Paiva, Débora M. B. and Borges, Hudson and Cagnin, Maria Istela and Fernandes, Patrícia Gomes and Borges, Vanessa and Melo, Silvana M. and Durelli, Vinicius H. S. and Canedo, Edna Dias},
ee = {https://doi.org/10.1145/3624032.3624039},
interhash = {4306e6763595766f8ba58563c581f2fa},
intrahash = {31efeb7914dd1c19538680e42433cecc},
keywords = {dblp},
pages = {47-53},
publisher = {ACM},
timestamp = {2024-04-09T19:13:40.000+0200},
title = {Machine Learning Techniques for Escaped Defect Analysis in Software Testing.},
url = {http://dblp.uni-trier.de/db/conf/sast/sast2023.html#NascimentoPMFCO23},
year = 2023
}