Abstract
The demand for simultaneous observation of photo-electron distributions
in several dimensions has made the hemispherical deflection analyzer
(HDA) and the time-of-flight (TOF) analyzer the dominating spectrometer
types. Some common limiting factors for resolution and sensitivity
are considered. Recent developments of the HDA and its lens system
which increase the energy range and angular acceptance are described.
The properties of a recently developed angle-resolving TOF system
(AR-TOF) are also described. The possibility to avoid integration
losses in energy or angular resolution by applying non-linear mappings
of the primary data is discussed.
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