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%0 Conference Paper
%1 conf/ats/HanaiYMYF01
%A Hanai, Hisayoshi
%A Yamada, Shinji
%A Mori, Hisaya
%A Yamashita, Eisaku
%A Funakura, Teruhiko
%B Asian Test Symposium
%D 2001
%I IEEE Computer Society
%K dblp
%P 460
%T Built-out Self-Test (BOST) for Analog Circuits in a System LSI: Test Solution to Reduce Test Costs.
%U http://dblp.uni-trier.de/db/conf/ats/ats2001.html#HanaiYMYF01
%@ 0-7695-1378-6
@inproceedings{conf/ats/HanaiYMYF01,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Hanai, Hisayoshi and Yamada, Shinji and Mori, Hisaya and Yamashita, Eisaku and Funakura, Teruhiko},
biburl = {https://www.bibsonomy.org/bibtex/271611a1c5eca67b08f162abf97e2c815/dblp},
booktitle = {Asian Test Symposium},
crossref = {conf/ats/2001},
ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990330},
interhash = {44af96bf3f9a2deb2020003978bc8abe},
intrahash = {71611a1c5eca67b08f162abf97e2c815},
isbn = {0-7695-1378-6},
keywords = {dblp},
pages = 460,
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T06:35:48.000+0200},
title = {Built-out Self-Test (BOST) for Analog Circuits in a System LSI: Test Solution to Reduce Test Costs.},
url = {http://dblp.uni-trier.de/db/conf/ats/ats2001.html#HanaiYMYF01},
year = 2001
}