%0 Conference Paper %1 conf/metrics/ElbaumGR01 %A Elbaum, Sebastian G. %A Gable, David %A Rothermel, Gregg %B IEEE METRICS %D 2001 %I IEEE Computer Society %K dblp %P 169- %T Understanding and Measuring the Sources of Variation in the Prioritization of Regression Test Suites. %U http://dblp.uni-trier.de/db/conf/metrics/metrics2001.html#ElbaumGR01 %@ 0-7695-1043-4

@inproceedings{conf/metrics/ElbaumGR01, added-at = {2023-03-23T00:00:00.000+0100}, author = {Elbaum, Sebastian G. and Gable, David and Rothermel, Gregg}, biburl = {https://www.bibsonomy.org/bibtex/27cf196843def5e9001cef8fec452b100/dblp}, booktitle = {IEEE METRICS}, crossref = {conf/metrics/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/METRIC.2001.915525}, interhash = {47fe977173f31ae3180dc2be17444cf4}, intrahash = {7cf196843def5e9001cef8fec452b100}, isbn = {0-7695-1043-4}, keywords = {dblp}, pages = {169-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T10:05:23.000+0200}, title = {Understanding and Measuring the Sources of Variation in the Prioritization of Regression Test Suites.}, url = {http://dblp.uni-trier.de/db/conf/metrics/metrics2001.html#ElbaumGR01}, year = 2001 }