%0 Conference Paper %1 conf/dac/RastogiCK07 %A Rastogi, Ashesh %A Chen, Wei %A Kundu, Sandip %B DAC %D 2007 %I IEEE %K dblp %P 712-715 %T On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method. %U http://dblp.uni-trier.de/db/conf/dac/dac2007.html#RastogiCK07

@inproceedings{conf/dac/RastogiCK07, added-at = {2018-11-06T00:00:00.000+0100}, author = {Rastogi, Ashesh and Chen, Wei and Kundu, Sandip}, biburl = {https://www.bibsonomy.org/bibtex/2205f248555d6538b2ee175dca2061dd4/dblp}, booktitle = {DAC}, crossref = {conf/dac/2007}, ee = {https://doi.org/10.1145/1278480.1278658}, interhash = {49706e1e33640cb37f4809ef7b3d0d05}, intrahash = {205f248555d6538b2ee175dca2061dd4}, keywords = {dblp}, pages = {712-715}, publisher = {IEEE}, timestamp = {2018-11-07T15:12:28.000+0100}, title = {On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac2007.html#RastogiCK07}, year = 2007 }