%0 Conference Paper %1 conf/irps/KumarUSKPHH23 %A Kumar, Akhil S. %A Uren, Michael J. %A Smith, Matthew D. %A Kuball, Martin %A Parke, Justin %A Henry, H. George %A Howell, Robert S. %B IRPS %D 2023 %I IEEE %K dblp %P 1-4 %T Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#KumarUSKPHH23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/KumarUSKPHH23, added-at = {2024-05-07T00:00:00.000+0200}, author = {Kumar, Akhil S. and Uren, Michael J. and Smith, Matthew D. and Kuball, Martin and Parke, Justin and Henry, H. George and Howell, Robert S.}, biburl = {https://www.bibsonomy.org/bibtex/2a744b3500e0a22539bff1eb5807c3b5d/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10118346}, interhash = {4a36523756d7441f0d742728d871b9bd}, intrahash = {a744b3500e0a22539bff1eb5807c3b5d}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-05-13T09:41:11.000+0200}, title = {Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#KumarUSKPHH23}, year = 2023 }