%0 Conference Paper %1 conf/aspdac/BahukudumbiOCI07 %A Bahukudumbi, Sudarshan %A Ozev, Sule %A Chakrabarty, Krishnendu %A Iyengar, Vikram %B ASP-DAC %D 2007 %I IEEE Computer Society %K %P 823-828 %T AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs. %U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2007.html#BahukudumbiOCI07 %@ 1-4244-0629-3

@inproceedings{conf/aspdac/BahukudumbiOCI07, added-at = {2023-12-12T22:28:54.000+0100}, author = {Bahukudumbi, Sudarshan and Ozev, Sule and Chakrabarty, Krishnendu and Iyengar, Vikram}, biburl = {https://www.bibsonomy.org/bibtex/222b5abf2c0ad689bb8defdbb82beca4f/admin}, booktitle = {ASP-DAC}, crossref = {conf/aspdac/2007}, ee = {http://dl.acm.org/citation.cfm?id=1323358}, interhash = {4ab93d5908951a0f00468d608c52c6e3}, intrahash = {22b5abf2c0ad689bb8defdbb82beca4f}, isbn = {1-4244-0629-3}, keywords = {}, pages = {823-828}, publisher = {IEEE Computer Society}, timestamp = {2023-12-12T22:28:54.000+0100}, title = {AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs.}, url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2007.html#BahukudumbiOCI07}, year = 2007 }