%0 Conference Paper %1 conf/iccad/KunduRJ88 %A Kundu, Sandip %A Reddy, Sudhakar M. %A Jha, Niraj K. %B ICCAD %D 1988 %I IEEE Computer Society %K dblp %P 240-243 %T On the design of robust multiple fault testable CMOS combinational logic circuits. %U http://dblp.uni-trier.de/db/conf/iccad/iccad1988.html#KunduRJ88 %@ 0-8186-0869-2

@inproceedings{conf/iccad/KunduRJ88, added-at = {2023-03-24T00:00:00.000+0100}, author = {Kundu, Sandip and Reddy, Sudhakar M. and Jha, Niraj K.}, biburl = {https://www.bibsonomy.org/bibtex/2dada705fdf12b79f47b0d8876c7f66f3/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/1988}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICCAD.1988.122502}, interhash = {4b15fdae98eff7fb532ab86b809ff96f}, intrahash = {dada705fdf12b79f47b0d8876c7f66f3}, isbn = {0-8186-0869-2}, keywords = {dblp}, pages = {240-243}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T20:52:30.000+0200}, title = {On the design of robust multiple fault testable CMOS combinational logic circuits.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad1988.html#KunduRJ88}, year = 1988 }