%0 Conference Paper %1 conf/issre/BalasubramaniIK16 %A Balasubramani, Uma M. %A Iyer, Kartik %A Krishnan, Balaji Santhana %A Kovvuri, Hema %B ISSRE Workshops %D 2016 %I IEEE Computer Society %K dblp %P 29-36 %T Bug Bash: An Efficient Approach to Increase Test Coverage and Ensure Product Quality in an Agile Environment. %U http://dblp.uni-trier.de/db/conf/issre/issre2016w.html#BalasubramaniIK16 %@ 978-1-5090-3601-1

@inproceedings{conf/issre/BalasubramaniIK16, added-at = {2023-03-24T00:00:00.000+0100}, author = {Balasubramani, Uma M. and Iyer, Kartik and Krishnan, Balaji Santhana and Kovvuri, Hema}, biburl = {https://www.bibsonomy.org/bibtex/2054bb46d3b07f5607a783d253fcb0281/dblp}, booktitle = {ISSRE Workshops}, crossref = {conf/issre/2016w}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISSREW.2016.16}, interhash = {4b4600815906b26ff15d3376452570f8}, intrahash = {054bb46d3b07f5607a783d253fcb0281}, isbn = {978-1-5090-3601-1}, keywords = {dblp}, pages = {29-36}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T14:57:57.000+0200}, title = {Bug Bash: An Efficient Approach to Increase Test Coverage and Ensure Product Quality in an Agile Environment.}, url = {http://dblp.uni-trier.de/db/conf/issre/issre2016w.html#BalasubramaniIK16}, year = 2016 }