%0 Journal Article %1 flueraru2000sensitivity %A Flueraru, C. %A Schrader, S. %A Motschmann, H. %A Zauls, V. %D 2000 %J Thin Solid Films %K diplom ellipsometrie %N 1-2 %P 15 - 22 %R 10.1016/S0040-6090(00)01195-0 %T Sensitivity analysis of ellipsometry applied to uniaxial optical films %U http://www.sciencedirect.com/science/article/B6TW0-41XM5PF-3/2/a5cd8eeb6ab7fcdc05413f50940f0dbf %V 379

@article{flueraru2000sensitivity, added-at = {2010-09-15T17:05:35.000+0200}, author = {Flueraru, C. and Schrader, S. and Motschmann, H. and Zauls, V.}, biburl = {https://www.bibsonomy.org/bibtex/25910d70daf6150eb5d2b3b7dbc42506d/bkoch}, description = {ScienceDirect - Thin Solid Films : Sensitivity analysis of ellipsometry applied to uniaxial optical films}, doi = {10.1016/S0040-6090(00)01195-0}, interhash = {4b91cbdad2fb3a27289b095150bffebe}, intrahash = {5910d70daf6150eb5d2b3b7dbc42506d}, issn = {0040-6090}, journal = {Thin Solid Films}, keywords = {diplom ellipsometrie}, number = {1-2}, pages = {15 - 22}, timestamp = {2010-09-15T17:05:36.000+0200}, title = {Sensitivity analysis of ellipsometry applied to uniaxial optical films}, url = {http://www.sciencedirect.com/science/article/B6TW0-41XM5PF-3/2/a5cd8eeb6ab7fcdc05413f50940f0dbf}, volume = 379, year = 2000 }