%0 Journal Article %1 journals/tcad/PomeranzR06b %A Pomeranz, Irith %A Reddy, Sudhakar M. %D 2006 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 10 %P 2207-2218 %T Generation of Functional Broadside Tests for Transition Faults. %U http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#PomeranzR06b %V 25

@article{journals/tcad/PomeranzR06b, added-at = {2020-09-24T00:00:00.000+0200}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2c4ba46889a5635b685a06b508b9e4deb/dblp}, ee = {https://doi.org/10.1109/TCAD.2005.860959}, interhash = {4c1676f9d17e3af8989488695c3e3fcb}, intrahash = {c4ba46889a5635b685a06b508b9e4deb}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 10, pages = {2207-2218}, timestamp = {2020-09-25T11:45:09.000+0200}, title = {Generation of Functional Broadside Tests for Transition Faults.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#PomeranzR06b}, volume = 25, year = 2006 }