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%0 Journal Article
%1 journals/tii/AdlyAYATMJLI15
%A Adly, Fatima
%A Alhussein, Omar
%A Yoo, Paul D.
%A Al-Hammadi, Yousof
%A Taha, Kamal
%A Muhaidat, Sami
%A Jeong, Young-Seon
%A Lee, Uihyoung
%A Ismail, Mohammed
%D 2015
%J IEEE Trans. Ind. Informatics
%K
%N 6
%P 1267-1276
%T Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps.
%U http://dblp.uni-trier.de/db/journals/tii/tii11.html#AdlyAYATMJLI15
%V 11
@article{journals/tii/AdlyAYATMJLI15,
added-at = {2023-12-12T22:43:28.000+0100},
author = {Adly, Fatima and Alhussein, Omar and Yoo, Paul D. and Al-Hammadi, Yousof and Taha, Kamal and Muhaidat, Sami and Jeong, Young-Seon and Lee, Uihyoung and Ismail, Mohammed},
biburl = {https://www.bibsonomy.org/bibtex/2008e6191b6fe096859d7adabe0f65df9/admin},
ee = {https://doi.org/10.1109/TII.2015.2481719},
interhash = {4d671f4e5f5647dde3ee1dd83dc6f218},
intrahash = {008e6191b6fe096859d7adabe0f65df9},
journal = {IEEE Trans. Ind. Informatics},
keywords = {},
number = 6,
pages = {1267-1276},
timestamp = {2023-12-12T22:43:28.000+0100},
title = {Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps.},
url = {http://dblp.uni-trier.de/db/journals/tii/tii11.html#AdlyAYATMJLI15},
volume = 11,
year = 2015
}