%0 Conference Paper %1 conf/date/HosseinabadyDN07 %A Hosseinabady, Mohammad %A Dalirsani, Atefe %A Navabi, Zainalabedin %B DATE %D 2007 %E Lauwereins, Rudy %E Madsen, Jan %I EDA Consortium, San Jose, CA, USA %K %P 361-366 %T Using the inter- and intra-switch regularity in NoC switch testing. %U http://dblp.uni-trier.de/db/conf/date/date2007.html#HosseinabadyDN07 %@ 978-3-9810801-2-4

@inproceedings{conf/date/HosseinabadyDN07, added-at = {2023-12-12T23:01:33.000+0100}, author = {Hosseinabady, Mohammad and Dalirsani, Atefe and Navabi, Zainalabedin}, biburl = {https://www.bibsonomy.org/bibtex/21107c7892a65465a7e649f60b5603ba5/admin}, booktitle = {DATE}, crossref = {conf/date/2007}, editor = {Lauwereins, Rudy and Madsen, Jan}, ee = {http://dl.acm.org/citation.cfm?id=1266443}, interhash = {514bf5fd7f4553676aa7d21f0d663669}, intrahash = {1107c7892a65465a7e649f60b5603ba5}, isbn = {978-3-9810801-2-4}, keywords = {}, pages = {361-366}, publisher = {EDA Consortium, San Jose, CA, USA}, timestamp = {2023-12-12T23:01:33.000+0100}, title = {Using the inter- and intra-switch regularity in NoC switch testing.}, url = {http://dblp.uni-trier.de/db/conf/date/date2007.html#HosseinabadyDN07}, year = 2007 }