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%0 Conference Paper
%1 conf/ats/ShengK10
%A Sheng, Xiaoqin
%A Kerkhoff, Hans G.
%B Asian Test Symposium
%D 2010
%I IEEE Computer Society
%K
%P 289-294
%T The Test Ability of an Adaptive Pulse Wave for ADC Testing.
%U http://dblp.uni-trier.de/db/conf/ats/ats2010.html#ShengK10
%@ 978-0-7695-4248-5
@inproceedings{conf/ats/ShengK10,
added-at = {2023-12-12T23:16:24.000+0100},
author = {Sheng, Xiaoqin and Kerkhoff, Hans G.},
biburl = {https://www.bibsonomy.org/bibtex/2791b931088fb22846acc56adf1cd27ab/admin},
booktitle = {Asian Test Symposium},
crossref = {conf/ats/2010},
ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2010.56},
interhash = {53df796b6efbac257ca5e3cdd384d7a3},
intrahash = {791b931088fb22846acc56adf1cd27ab},
isbn = {978-0-7695-4248-5},
keywords = {},
pages = {289-294},
publisher = {IEEE Computer Society},
timestamp = {2023-12-12T23:16:24.000+0100},
title = {The Test Ability of an Adaptive Pulse Wave for ADC Testing.},
url = {http://dblp.uni-trier.de/db/conf/ats/ats2010.html#ShengK10},
year = 2010
}