%0 Conference Paper %1 conf/icst/ShinYB16 %A Shin, Donghwan %A Yoo, Shin %A Bae, Doo-Hwan %B ICST Workshops %D 2016 %I IEEE Computer Society %K dblp %P 122-131 %T Diversity-Aware Mutation Adequacy Criterion for Improving Fault Detection Capability. %U http://dblp.uni-trier.de/db/conf/icst/icstw2016.html#ShinYB16 %@ 978-1-5090-3674-5

@inproceedings{conf/icst/ShinYB16, added-at = {2023-03-23T00:00:00.000+0100}, author = {Shin, Donghwan and Yoo, Shin and Bae, Doo-Hwan}, biburl = {https://www.bibsonomy.org/bibtex/2c4dbd947f80c5ea440bcd2ebff102545/dblp}, booktitle = {ICST Workshops}, crossref = {conf/icst/2016w}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICSTW.2016.37}, interhash = {54adbde61f1dd14c462e929d8ef32593}, intrahash = {c4dbd947f80c5ea440bcd2ebff102545}, isbn = {978-1-5090-3674-5}, keywords = {dblp}, pages = {122-131}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T16:23:51.000+0200}, title = {Diversity-Aware Mutation Adequacy Criterion for Improving Fault Detection Capability.}, url = {http://dblp.uni-trier.de/db/conf/icst/icstw2016.html#ShinYB16}, year = 2016 }