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%0 Conference Paper
%1 conf/iccad/TsaiYLN08
%A Tsai, Kuen-Yu
%A You, Meng-Fu
%A Lu, Yi-Chang
%A Ng, Philip C. W.
%B ICCAD
%D 2008
%E Nassif, Sani R.
%E Roychowdhury, Jaijeet S.
%I IEEE Computer Society
%K dblp
%P 286-291
%T A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects.
%U http://dblp.uni-trier.de/db/conf/iccad/iccad2008.html#TsaiYLN08
%@ 978-1-4244-2820-5
@inproceedings{conf/iccad/TsaiYLN08,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Tsai, Kuen-Yu and You, Meng-Fu and Lu, Yi-Chang and Ng, Philip C. W.},
biburl = {https://www.bibsonomy.org/bibtex/23f3095808eba79a8c0819769e439de35/dblp},
booktitle = {ICCAD},
crossref = {conf/iccad/2008},
editor = {Nassif, Sani R. and Roychowdhury, Jaijeet S.},
ee = {https://dl.acm.org/citation.cfm?id=1509525},
interhash = {5678915b747f8e09f5ae36e4d2ff0f3d},
intrahash = {3f3095808eba79a8c0819769e439de35},
isbn = {978-1-4244-2820-5},
keywords = {dblp},
pages = {286-291},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T17:54:13.000+0200},
title = {A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects.},
url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2008.html#TsaiYLN08},
year = 2008
}