%0 Conference Paper %1 conf/irps/NakanumaSIKSOHS22 %A Nakanuma, Takato %A Suzuki, Asato %A Iwakata, Yu %A Kobayashi, Takuma %A Sometani, Mitsuru %A Okamoto, Mitsuo %A Hosoi, Takuji %A Shimura, Takayoshi %A Watanabe, Heiji %B IRPS %D 2022 %I IEEE %K dblp %P 3 %T Investigation of reliability of NO nitrided SiC(1100) MOS devices. %U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#NakanumaSIKSOHS22 %@ 978-1-6654-7950-9

@inproceedings{conf/irps/NakanumaSIKSOHS22, added-at = {2023-09-30T00:00:00.000+0200}, author = {Nakanuma, Takato and Suzuki, Asato and Iwakata, Yu and Kobayashi, Takuma and Sometani, Mitsuru and Okamoto, Mitsuo and Hosoi, Takuji and Shimura, Takayoshi and Watanabe, Heiji}, biburl = {https://www.bibsonomy.org/bibtex/2b8ef4302ec83fbea168249604bd5c039/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2022}, ee = {https://doi.org/10.1109/IRPS48227.2022.9764595}, interhash = {58fc71b68f2bb6b77c15ac98d03e657b}, intrahash = {b8ef4302ec83fbea168249604bd5c039}, isbn = {978-1-6654-7950-9}, keywords = {dblp}, pages = 3, publisher = {IEEE}, timestamp = {2024-04-09T12:18:58.000+0200}, title = {Investigation of reliability of NO nitrided SiC(1100) MOS devices.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#NakanumaSIKSOHS22}, year = 2022 }