%0 Conference Paper %1 conf/ats/ShinogiYHYT03 %A Shinogi, Tsuyoshi %A Yamada, Yuki %A Hayashi, Terumine %A Yoshikawa, Tomohiro %A Tsuruoka, Shinji %B Asian Test Symposium %D 2003 %I IEEE Computer Society %K dblp %P 268-273 %T Between-Core Vector Overlapping for Test Cost Reduction in Core Testing. %U http://dblp.uni-trier.de/db/conf/ats/ats2003.html#ShinogiYHYT03 %@ 0-7695-1951-2

@inproceedings{conf/ats/ShinogiYHYT03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Shinogi, Tsuyoshi and Yamada, Yuki and Hayashi, Terumine and Yoshikawa, Tomohiro and Tsuruoka, Shinji}, biburl = {https://www.bibsonomy.org/bibtex/2f01e8951bd2b78e20b058f5d9da5bb70/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250821}, interhash = {59e2c517872032a591878bcff4ecb58c}, intrahash = {f01e8951bd2b78e20b058f5d9da5bb70}, isbn = {0-7695-1951-2}, keywords = {dblp}, pages = {268-273}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:36.000+0200}, title = {Between-Core Vector Overlapping for Test Cost Reduction in Core Testing.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2003.html#ShinogiYHYT03}, year = 2003 }