%0 Journal Article %1 journals/tvlsi/KraakTAHWCC19 %A Kraak, Daniel %A Taouil, Mottaqiallah %A Agbo, Innocent %A Hamdioui, Said %A Weckx, Pieter %A Cosemans, Stefan %A Catthoor, Francky %D 2019 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 6 %P 1308-1321 %T Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#KraakTAHWCC19 %V 27

@article{journals/tvlsi/KraakTAHWCC19, added-at = {2020-03-11T00:00:00.000+0100}, author = {Kraak, Daniel and Taouil, Mottaqiallah and Agbo, Innocent and Hamdioui, Said and Weckx, Pieter and Cosemans, Stefan and Catthoor, Francky}, biburl = {https://www.bibsonomy.org/bibtex/2e02843a281c2f9f0b1d70893dcf75007/dblp}, ee = {https://doi.org/10.1109/TVLSI.2019.2902881}, interhash = {5a0570b14e2c0aea6586f029211bde99}, intrahash = {e02843a281c2f9f0b1d70893dcf75007}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 6, pages = {1308-1321}, timestamp = {2020-03-12T11:42:43.000+0100}, title = {Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#KraakTAHWCC19}, volume = 27, year = 2019 }