%0 Conference Paper %1 conf/patmos/NoltsisMRCS17 %A Noltsis, Michail %A Maragkoudaki, Eleni %A Rodopoulos, Dimitrios %A Catthoor, Francky %A Soudris, Dimitrios %B PATMOS %D 2017 %I IEEE %K dblp %P 1-8 %T Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point. %U http://dblp.uni-trier.de/db/conf/patmos/patmos2017.html#NoltsisMRCS17 %@ 978-1-5090-6462-5

@inproceedings{conf/patmos/NoltsisMRCS17, added-at = {2017-11-23T00:00:00.000+0100}, author = {Noltsis, Michail and Maragkoudaki, Eleni and Rodopoulos, Dimitrios and Catthoor, Francky and Soudris, Dimitrios}, biburl = {https://www.bibsonomy.org/bibtex/2acf3ff781b2f5e403b6ad48276bf2a56/dblp}, booktitle = {PATMOS}, crossref = {conf/patmos/2017}, ee = {https://doi.org/10.1109/PATMOS.2017.8106967}, interhash = {5a1faa91023b867491dad122897c88ec}, intrahash = {acf3ff781b2f5e403b6ad48276bf2a56}, isbn = {978-1-5090-6462-5}, keywords = {dblp}, pages = {1-8}, publisher = {IEEE}, timestamp = {2019-10-17T13:26:07.000+0200}, title = {Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point.}, url = {http://dblp.uni-trier.de/db/conf/patmos/patmos2017.html#NoltsisMRCS17}, year = 2017 }