%0 Conference Paper %1 conf/itc/SchanstraLGVW98 %A Schanstra, Ivo %A Lukita, Dharmajaya %A van de Goor, Ad J. %A Veelenturf, Kees %A van Wijnen, Paul J. %B ITC %D 1998 %I IEEE Computer Society %K dblp %P 872-881 %T Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. %U http://dblp.uni-trier.de/db/conf/itc/itc1998.html#SchanstraLGVW98 %@ 0-7803-5093-6

@inproceedings{conf/itc/SchanstraLGVW98, added-at = {2023-03-23T00:00:00.000+0100}, author = {Schanstra, Ivo and Lukita, Dharmajaya and van de Goor, Ad J. and Veelenturf, Kees and van Wijnen, Paul J.}, biburl = {https://www.bibsonomy.org/bibtex/2bd707ae481a0aaa75fddee5bf5c32939/dblp}, booktitle = {ITC}, crossref = {conf/itc/1998}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1998.743277}, interhash = {5a4b6f7750366dee1b21c9296d92886c}, intrahash = {bd707ae481a0aaa75fddee5bf5c32939}, isbn = {0-7803-5093-6}, keywords = {dblp}, pages = {872-881}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:01.000+0200}, title = {Semiconductor manufacturing process monitoring using built-in self-test for embedded memories.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1998.html#SchanstraLGVW98}, year = 1998 }