%0 Conference Paper %1 conf/iasam/SpencerL08 %A Spencer, Matthew L. %A Lorenz, Robert D. %B IAS %D 2008 %I IEEE %K dblp %P 1-7 %T Analysis and In-Situ Measurement of Thermal-Mechanical Strain in Active Silicon Power Semiconductors. %U http://dblp.uni-trier.de/db/conf/iasam/iasam2008.html#SpencerL08 %@ 978-1-4244-2278-4

@inproceedings{conf/iasam/SpencerL08, added-at = {2017-05-21T00:00:00.000+0200}, author = {Spencer, Matthew L. and Lorenz, Robert D.}, biburl = {https://www.bibsonomy.org/bibtex/2fd4d9d064b8334c72e00df1ea0569665/dblp}, booktitle = {IAS}, crossref = {conf/iasam/2008}, ee = {https://doi.org/10.1109/08IAS.2008.360}, interhash = {5b082d08f8f33b73ce6915e08aa763a3}, intrahash = {fd4d9d064b8334c72e00df1ea0569665}, isbn = {978-1-4244-2278-4}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2024-08-05T07:17:17.000+0200}, title = {Analysis and In-Situ Measurement of Thermal-Mechanical Strain in Active Silicon Power Semiconductors.}, url = {http://dblp.uni-trier.de/db/conf/iasam/iasam2008.html#SpencerL08}, year = 2008 }