%0 Journal Article %1 journals/mr/FilippisKDDKI11 %A de Filippis, Stefano %A Kosel, Vladimír %A Dibra, Donald %A Decker, Stefan %A Köck, Helmut %A Irace, Andrea %D 2011 %J Microelectron. Reliab. %K %N 9-11 %P 1954-1958 %T ANSYS based 3D electro-thermal simulations for the evaluation of power MOSFETs robustness. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#FilippisKDDKI11 %V 51

@article{journals/mr/FilippisKDDKI11, added-at = {2023-12-12T23:51:03.000+0100}, author = {de Filippis, Stefano and Kosel, Vladimír and Dibra, Donald and Decker, Stefan and Köck, Helmut and Irace, Andrea}, biburl = {https://www.bibsonomy.org/bibtex/26eddebc978ba82417f17847fa312c280/admin}, ee = {https://doi.org/10.1016/j.microrel.2011.06.047}, interhash = {5b2b32525ccfb7a0ff8d1a7f886328ff}, intrahash = {6eddebc978ba82417f17847fa312c280}, journal = {Microelectron. Reliab.}, keywords = {}, number = {9-11}, pages = {1954-1958}, timestamp = {2023-12-12T23:51:03.000+0100}, title = {ANSYS based 3D electro-thermal simulations for the evaluation of power MOSFETs robustness.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#FilippisKDDKI11}, volume = 51, year = 2011 }