%0 Journal Article %1 journals/tdsc/LiTGWLL22 %A Li, Qiang %A Tan, Dawei %A Ge, Xin %A Wang, Haining %A Li, Zhi %A Liu, Jiqiang %D 2022 %J IEEE Trans. Dependable Secur. Comput. %K dblp %N 6 %P 4099-4112 %T Understanding Security Risks of Embedded Devices Through Fine-Grained Firmware Fingerprinting. %U http://dblp.uni-trier.de/db/journals/tdsc/tdsc19.html#LiTGWLL22 %V 19

@article{journals/tdsc/LiTGWLL22, added-at = {2023-07-27T00:00:00.000+0200}, author = {Li, Qiang and Tan, Dawei and Ge, Xin and Wang, Haining and Li, Zhi and Liu, Jiqiang}, biburl = {https://www.bibsonomy.org/bibtex/2524a9ff42218ce38a0375b6385c9217a/dblp}, ee = {https://doi.org/10.1109/TDSC.2021.3119970}, interhash = {5ba1e68c1e7f8f1887cf947f64a76dd2}, intrahash = {524a9ff42218ce38a0375b6385c9217a}, journal = {IEEE Trans. Dependable Secur. Comput.}, keywords = {dblp}, number = 6, pages = {4099-4112}, timestamp = {2024-04-09T06:54:33.000+0200}, title = {Understanding Security Risks of Embedded Devices Through Fine-Grained Firmware Fingerprinting.}, url = {http://dblp.uni-trier.de/db/journals/tdsc/tdsc19.html#LiTGWLL22}, volume = 19, year = 2022 }