%0 Conference Paper %1 conf/caip/ParkKK17 %A Park, YangSub %A Kang, KilBum %A Kim, SeongSoo %B CAIP (1) %D 2017 %E Felsberg, Michael %E Heyden, Anders %E Krüger, Norbert %I Springer %K dblp %P 219-227 %T A Visual Inspection Method Based on Periodic Feature for Wheel Mark Defect on Wafer Backside. %U http://dblp.uni-trier.de/db/conf/caip/caip2017-1.html#ParkKK17 %V 10424 %@ 978-3-319-64689-3

@inproceedings{conf/caip/ParkKK17, added-at = {2017-08-15T00:00:00.000+0200}, author = {Park, YangSub and Kang, KilBum and Kim, SeongSoo}, biburl = {https://www.bibsonomy.org/bibtex/20ab7f26b3587d1c82e915580d4681d0d/dblp}, booktitle = {CAIP (1)}, crossref = {conf/caip/2017-1}, editor = {Felsberg, Michael and Heyden, Anders and Krüger, Norbert}, ee = {https://doi.org/10.1007/978-3-319-64689-3_18}, interhash = {602d7bb27a19e39f79c67369f021e0e4}, intrahash = {0ab7f26b3587d1c82e915580d4681d0d}, isbn = {978-3-319-64689-3}, keywords = {dblp}, pages = {219-227}, publisher = {Springer}, series = {Lecture Notes in Computer Science}, timestamp = {2019-06-04T12:52:50.000+0200}, title = {A Visual Inspection Method Based on Periodic Feature for Wheel Mark Defect on Wafer Backside.}, url = {http://dblp.uni-trier.de/db/conf/caip/caip2017-1.html#ParkKK17}, volume = 10424, year = 2017 }