40-nm Embedded Split-Gate MONOS (SG-MONOS) Flash Macros for Automotive With 160-MHz Random Access for Code and Endurance Over 10 M Cycles for Data at the Junction Temperature of 170°C.
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%0 Journal Article
%1 journals/jssc/KonoITNNOKHY14
%A Kono, Takashi
%A Ito, Takashi
%A Tsuruda, Tamaki
%A Nishiyama, Takayuki
%A Nagasawa, Tsutomu
%A Ogawa, Tomoya
%A Kawashima, Yoshiyuki
%A Hidaka, Hideto
%A Yamauchi, Tadaaki
%D 2014
%J IEEE J. Solid State Circuits
%K dblp
%N 1
%P 154-166
%T 40-nm Embedded Split-Gate MONOS (SG-MONOS) Flash Macros for Automotive With 160-MHz Random Access for Code and Endurance Over 10 M Cycles for Data at the Junction Temperature of 170°C.
%U http://dblp.uni-trier.de/db/journals/jssc/jssc49.html#KonoITNNOKHY14
%V 49
@article{journals/jssc/KonoITNNOKHY14,
added-at = {2020-08-30T00:00:00.000+0200},
author = {Kono, Takashi and Ito, Takashi and Tsuruda, Tamaki and Nishiyama, Takayuki and Nagasawa, Tsutomu and Ogawa, Tomoya and Kawashima, Yoshiyuki and Hidaka, Hideto and Yamauchi, Tadaaki},
biburl = {https://www.bibsonomy.org/bibtex/206b06123c5e19b0f57bf8a330d3080e3/dblp},
ee = {https://doi.org/10.1109/JSSC.2013.2280303},
interhash = {6199e2e975f712b34984f5fb1e229ce9},
intrahash = {06b06123c5e19b0f57bf8a330d3080e3},
journal = {IEEE J. Solid State Circuits},
keywords = {dblp},
number = 1,
pages = {154-166},
timestamp = {2020-08-31T11:43:22.000+0200},
title = {40-nm Embedded Split-Gate MONOS (SG-MONOS) Flash Macros for Automotive With 160-MHz Random Access for Code and Endurance Over 10 M Cycles for Data at the Junction Temperature of 170°C.},
url = {http://dblp.uni-trier.de/db/journals/jssc/jssc49.html#KonoITNNOKHY14},
volume = 49,
year = 2014
}
