%0 Conference Paper %1 conf/imw2/RonchiRCKKBMbH22 %A Ronchi, Nicolo %A Ragnarsson, Lars-Åke %A Celano, Umberto %A Kaczer, Ben %A Kaczmarek, K. %A Banerjee, K. %A McMitchell, Sean R. C. %A den Bosch, G. Van %A Houdt, Jan Van %B IMW %D 2022 %I IEEE %K dblp %P 1-4 %T A comprehensive variability study of doped HfO2 FeFET for memory applications. %U http://dblp.uni-trier.de/db/conf/imw2/imw2022.html#RonchiRCKKBMbH22 %@ 978-1-6654-9947-7

@inproceedings{conf/imw2/RonchiRCKKBMbH22, added-at = {2023-11-13T00:00:00.000+0100}, author = {Ronchi, Nicolo and Ragnarsson, Lars-Åke and Celano, Umberto and Kaczer, Ben and Kaczmarek, K. and Banerjee, K. and McMitchell, Sean R. C. and den Bosch, G. Van and Houdt, Jan Van}, biburl = {https://www.bibsonomy.org/bibtex/2e516df9b137034880ac3c822f0c0175d/dblp}, booktitle = {IMW}, crossref = {conf/imw2/2022}, ee = {https://doi.org/10.1109/IMW52921.2022.9779294}, interhash = {61be6d43319c1a85bba20b748f70b203}, intrahash = {e516df9b137034880ac3c822f0c0175d}, isbn = {978-1-6654-9947-7}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-09T19:34:06.000+0200}, title = {A comprehensive variability study of doped HfO2 FeFET for memory applications.}, url = {http://dblp.uni-trier.de/db/conf/imw2/imw2022.html#RonchiRCKKBMbH22}, year = 2022 }