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%0 Conference Paper
%1 conf/dft/BaxterM95
%A Baxter, M.
%A Muir, D.
%B DFT
%D 1995
%I IEEE Computer Society
%K dblp
%P 164-172
%T Using defect density modelling to drive the optimisation of circuit layout, maximising yield.
%U http://dblp.uni-trier.de/db/conf/dft/dft1995.html#BaxterM95
%@ 0-8186-7107-6
@inproceedings{conf/dft/BaxterM95,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Baxter, M. and Muir, D.},
biburl = {https://www.bibsonomy.org/bibtex/230a430f15f71b86c4fa247b381ed18b8/dblp},
booktitle = {DFT},
crossref = {conf/dft/1995},
ee = {https://doi.ieeecomputersociety.org/10.1109/DFTVS.1995.476949},
interhash = {61d056f504e79f999461f7491f2664ad},
intrahash = {30a430f15f71b86c4fa247b381ed18b8},
isbn = {0-8186-7107-6},
keywords = {dblp},
pages = {164-172},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T20:00:51.000+0200},
title = {Using defect density modelling to drive the optimisation of circuit layout, maximising yield.},
url = {http://dblp.uni-trier.de/db/conf/dft/dft1995.html#BaxterM95},
year = 1995
}