%0 Conference Paper %1 conf/irps/TatenoNOMKOHIYN21 %A Tateno, Yasunori %A Nakata, Ken %A Oya, Akio %A Matsuda, Keita %A Komatsu, Yoshihide %A Osada, Shinichi %A Hirata, Masafumi %A Ishiyama, Shigeyuki %A Yoda, Toshiki %A Nitta, Atsushi %A Sato, Tomio %B IRPS %D 2021 %I IEEE %K dblp %P 1-4 %T Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests. %U http://dblp.uni-trier.de/db/conf/irps/irps2021.html#TatenoNOMKOHIYN21 %@ 978-1-7281-6893-7

@inproceedings{conf/irps/TatenoNOMKOHIYN21, added-at = {2021-05-05T00:00:00.000+0200}, author = {Tateno, Yasunori and Nakata, Ken and Oya, Akio and Matsuda, Keita and Komatsu, Yoshihide and Osada, Shinichi and Hirata, Masafumi and Ishiyama, Shigeyuki and Yoda, Toshiki and Nitta, Atsushi and Sato, Tomio}, biburl = {https://www.bibsonomy.org/bibtex/28df5454201b3393f85871b8eff88b312/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2021}, ee = {https://doi.org/10.1109/IRPS46558.2021.9405166}, interhash = {61da81a84b1dcb276451f3a7fc95c264}, intrahash = {8df5454201b3393f85871b8eff88b312}, isbn = {978-1-7281-6893-7}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:55.000+0200}, title = {Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2021.html#TatenoNOMKOHIYN21}, year = 2021 }