%0 Conference Paper %1 conf/cav/SinghBM17 %A Singh, Eshan %A Barrett, Clark W. %A Mitra, Subhasish %B CAV (2) %D 2017 %E Majumdar, Rupak %E Kuncak, Viktor %I Springer %K dblp %P 104-125 %T E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods. %U http://dblp.uni-trier.de/db/conf/cav/cav2017-2.html#SinghBM17 %V 10427 %@ 978-3-319-63390-9

@inproceedings{conf/cav/SinghBM17, added-at = {2021-07-25T00:00:00.000+0200}, author = {Singh, Eshan and Barrett, Clark W. and Mitra, Subhasish}, biburl = {https://www.bibsonomy.org/bibtex/21e0e93632d9098eec27b49a8c7428a43/dblp}, booktitle = {CAV (2)}, crossref = {conf/cav/2017-2}, editor = {Majumdar, Rupak and Kuncak, Viktor}, ee = {https://doi.org/10.1007/978-3-319-63390-9_6}, interhash = {62e09cff33a47d9e9da2644b73ad561b}, intrahash = {1e0e93632d9098eec27b49a8c7428a43}, isbn = {978-3-319-63390-9}, keywords = {dblp}, pages = {104-125}, publisher = {Springer}, series = {Lecture Notes in Computer Science}, timestamp = {2024-04-10T04:26:48.000+0200}, title = {E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods.}, url = {http://dblp.uni-trier.de/db/conf/cav/cav2017-2.html#SinghBM17}, volume = 10427, year = 2017 }