%0 Conference Paper %1 conf/ats/BaiHWCCLCL13 %A Bai, Bing-Chuan %A Hsu, Chun-Lung %A Wu, Ming-Hsueh %A Chen, Chen-An %A Chen, Yee-Wen %A Luo, Kun-Lun %A Cheng, Liang-Chia %A Li, James Chien-Mo %B Asian Test Symposium %D 2013 %I IEEE Computer Society %K dblp %P 123-127 %T Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM. %U http://dblp.uni-trier.de/db/conf/ats/ats2013.html#BaiHWCCLCL13 %@ 978-0-7695-5080-0

@inproceedings{conf/ats/BaiHWCCLCL13, added-at = {2023-03-24T00:00:00.000+0100}, author = {Bai, Bing-Chuan and Hsu, Chun-Lung and Wu, Ming-Hsueh and Chen, Chen-An and Chen, Yee-Wen and Luo, Kun-Lun and Cheng, Liang-Chia and Li, James Chien-Mo}, biburl = {https://www.bibsonomy.org/bibtex/22d06f23b80ccf3a8234e0ddf26669b5f/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2013}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2013.32}, interhash = {651dcc80851d408c5c2731b4a53f8642}, intrahash = {2d06f23b80ccf3a8234e0ddf26669b5f}, isbn = {978-0-7695-5080-0}, keywords = {dblp}, pages = {123-127}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:09.000+0200}, title = {Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2013.html#BaiHWCCLCL13}, year = 2013 }