%0 Journal Article %1 journals/tcad/RadhakrishnanYS20 %A Radhakrishnan, Govind %A Yoon, Youngki %A Sachdev, Manoj %D 2020 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 12 %P 4645-4656 %T Monitoring Aging Defects in STT-MRAMs. %U http://dblp.uni-trier.de/db/journals/tcad/tcad39.html#RadhakrishnanYS20 %V 39

@article{journals/tcad/RadhakrishnanYS20, added-at = {2020-12-01T00:00:00.000+0100}, author = {Radhakrishnan, Govind and Yoon, Youngki and Sachdev, Manoj}, biburl = {https://www.bibsonomy.org/bibtex/28e0efa8fe3bb71783b10f0a96ac83d33/dblp}, ee = {https://doi.org/10.1109/TCAD.2020.2982145}, interhash = {67dd7b7d4827fb85b9f1c6718dc4063c}, intrahash = {8e0efa8fe3bb71783b10f0a96ac83d33}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 12, pages = {4645-4656}, timestamp = {2024-04-08T19:46:30.000+0200}, title = {Monitoring Aging Defects in STT-MRAMs.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad39.html#RadhakrishnanYS20}, volume = 39, year = 2020 }